Project: RADAR

Project: RADAR (reliability-aware design and adaptive reconfiguration)

Various reliability issues have manifested; for example, increased process variation may cause unexpected circuit failures. Processor chip yields are staggering due to aggressive scaling and high complexity involved in the design and manufacturing process. In this research, we are investigating how processor design practices have to be changed to overcome the serious reliability and yield erosion problems. This project is supported partly by a grant from the NSF and A. Richard Newton Graduate Research Scholarship from DAC. This research is jointly done with Prof. Bruce Childers.


Selected Publications