Various reliability issues have manifested; for example, increased process variation may cause unexpected circuit failures.
Processor chip yields are staggering due to aggressive scaling and high complexity involved in the design and manufacturing process.
In this research, we are investigating how processor design practices have to be changed to overcome the serious reliability and yield erosion problems.
This project is supported partly by a grant from the NSF and A. Richard Newton Graduate Research Scholarship from DAC.
This research is jointly done with Prof. Bruce Childers.
Selected Publications
Musfiq Rahman, Bruce R. Childers and Sangyeun Cho,
COMeT: Continuous Online Memory Test,
Proceedings of the 17th IEEE Pacific Rim Int'l Symposium on Dependable Computing (PRDC),
pp. 109~118,
Pasadena, California, December 2011.
(pdf)(pptx)
Musfiq Rahman, Sangyeun Cho, and Bruce R. Childers,
StealthWorks: Emulating Main Memory Errors,
Proceedings of the 1st International Conference on Runtime Verification (RV 2010),
pp. 360~367,
Sliema, Malta, November 2010.
A short paper.
(pdf)